The reflectivity of relativistic ultra-thin electron layers

The coherent reflectivity of a dense, relativistic, ultra-thin electron layer is derived analytically for an obliquely incident probe beam. Results are obtained by two-fold Lorentz transformation. For the analytical treatment, a plane uniform electron layer is considered. All electrons move with uniform velocity under an angle to the normal direction of the plane; such electron motion corresponds to laser acceleration by direct action of the laser fields, as it is described in a companion paper (paper I). Electron density is chosen high enough to ensure that many electrons reside in a volume λ3R, where λR is the wavelength of the reflected light in the rest frame of the layer. Under these conditions, the probe light is back-scattered coherently and is directed close to the layer normal rather than the direction of electron velocity. An important consequence is that the Doppler shift is governed by γx = (1 − (Vx/c) ) derived from the electron velocity component Vx in normal direction rather than the full γ-factor of the layer electrons. PACS. 52.38.Ph X-ray, γ-ray, and particle generation – 52.38.-f Intense particle beams and radiation source in physics of plasma – 52.59.Ye Plasma devices for generation of coherent radiation